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العنوان
Surface studies by microanalytical techniques /
الناشر
Hany Talaat Ahmad Ali Mohsen,
المؤلف
Mohsen, Hany Talaat Ahmad Ali.
الموضوع
Physics.
تاريخ النشر
2004 .
عدد الصفحات
150 p. :
الفهرس
Only 14 pages are availabe for public view

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from 181

Abstract

Two elemental microprobe spectrometers, scanning electron microscope (SEM) JSM-5600-LV equipped with energy dispersive x-ray spectrometer (EDX) OXFORD and laser ablation (LA) GEOLAS-MERCHANTEK attached to double focusing inductively coupled plasma mass spectrometer (ICP-MS) JMS-PLSMAX2, are used in the study. Optimization of the operational parameters of the spectrometers are performed to reach good precision and accuracy for measuring concentrations of major, minor elements and oxides using SEM-EDX, and trace element concentrations using LA-ICP-MS in solids. The thesis includes four chapters. Chapter (1), includes an introduction and aim of the work. Chapter (2) contains the theoretical considerations and technical aspects of the energy dispersive x-ray spectrometer and its combination with the scanning electron microscope producing microprobe spectrometer for solid surfaces. Moreover, the theoretical considerations and technical concepts of the laser ablation system and its attachment to the double focusing inductively coupled plasma mass spectrometer producing microprobe trace elemental analyses for solid surfaces and bulk materials. ABSTRACT 2 Chapter (3), explains the experimental setup and the operational conditions of the present work using the SEMEDX and LA-ICP-MS microprobes. Chapter (4), contains the measurements and the results of elemental and oxide concentrations in the range of major, minor and traces. Different solid standard reference materials are measured using SEM-EDX as follows: · AGV-2 (elements and oxides) · GSP-2 (elements and oxides) · BCR-2 (elements and oxides) · Stainless steel 303 · Stainless steel 845 · Samarium-cobalt powder · NIST 1515 (apple leaves) Others measured by LA-ICP-MS as follows: · NIST 1515 (apple leaves) · NIST 611 (glass) · NIST 612 (glass) Geological samples are measured using SEM-EDX and LAICP-MS as follows: · Three allanite samples (for REE measurments). · Zonation in allanite and hornblende. · Four different beryl samples.ABSTRACT 3 · Materials of the skimmer cone. The present work demonstrates that the skimmer materials (Au, Ag, Ni, Cu and Al) are participating in the formation of polyatomic ions. Heats of formation of polyatomic species formed from the skimmer materials such as: AuX, AgX, NiX, CuX and AlX, where X =Ar, O, N and H, are calculated by the Gaussian program (G94W).