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العنوان
Study of Some Physical Properties of Thin Films /
المؤلف
Mohammed, Mustafa Mohammed Fadel.
هيئة الاعداد
باحث / مصطفى محمد فاضل
مشرف / ا.د / احمد الفلكى السيد
مشرف / د / كرم فتحى عبدالرحمن
مناقش / ا.د / احمد الفلكى السيد
الموضوع
Physical science. Physical science - Congresses.
تاريخ النشر
2014.
عدد الصفحات
109 p. :
اللغة
الإنجليزية
الدرجة
ماجستير
التخصص
فيزياء المادة المكثفة
تاريخ الإجازة
1/1/2014
مكان الإجازة
جامعة الزقازيق - كلية العلوم - الفيزياء
الفهرس
Only 14 pages are availabe for public view

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Abstract

The present thesis is devoted to investigate the structure, optical and ac electrical properties of the as-deposited Se90S10-xCdx i) The structure properties for Se (x=0 and 5) thin films. 90S10-xCdx (x=0 and 5) compositions include:- 1- X-ray diffraction Patterns XRD of Se90S10-xCdx 2- Differential thermal analysis DTA of the investigated compositions in powder form. (x=0 and 5) in powder and thin film forms. 3- Energy dispersive X-ray spectroscopy EDX to check the constituent elements of the studied compositions. ii) The optical properties include the determination and analysis of the optical constants (refractive index n and the absorption index k) for the as deposited Se90S10-xCdx (x=0 and 5) film compositions using spectrophotometric method in the spectral range (350-2500nm). iii) The electrical properties were studied for the as-deposited Se90S10-xCdx (x=0 and 5) film compositions included the ac conductivity and dielectric properties in the frequency range (50Hz-5MHz). Contents