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العنوان
Modelling of Sol-Gel Precursor and Nano Particles Structure characteristics for Nickel Oxide /
المؤلف
Hashim, Rajaa Mohammed Ali.
هيئة الاعداد
باحث / رجاء محمد علي هاشم
مشرف / محمد جلال سيد علي
مشرف / محمد أحمد رفعت عبيد
الموضوع
Physics.
تاريخ النشر
2015.
عدد الصفحات
62 p. :
اللغة
الإنجليزية
الدرجة
ماجستير
التخصص
الفيزياء وعلم الفلك
تاريخ الإجازة
1/1/2015
مكان الإجازة
جامعة المنيا - كلية العلوم - قسم الفيزياء (الفيزياء النظرية)
الفهرس
Only 14 pages are availabe for public view

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Abstract

The aim of this thesis was to separate the XRD amorphous diffraction rather background of nanostructure NiO material prepared by sol gel method to obtain the characterization of non-crystalline of materials. The MAUD program was used to refine the NiO structure. To verify the results,two phases (amorphous and crystalline) diffraction with known background and amorphous fraction was simulated. The pair distribution function (PDF) of both simulated and extruded (by MAUD) diffractions were compared, which has taken the same characterization. The results showed that the full profile analysis can be used to separate the amorphous intensities and background correctly, rather the amorphous fraction or crystalline degree for complex materials and polymers. The general outline of the thesis as follows: chapter 1 reviews of structural consideration. Crystalline structure analysis and pair distribution function techniques for crystalline and non-crystalline material are investigated in chapter 2. The sol-gel method is more suitable for the synthesis of amorphous andcrystallinematerials than conventional methods. Chapter 3 presented an experimental of the NiO nanoparticles which are prepared by sol-gel method to produce two phases (crystalline and amorphous). The structure and microstructural analysis are carried out using MAUD based on Rietveld method. In chapter 4, the amorphous fraction contribution is treated as background in MAUD program, and the experimental is calculated by MAUD for a reference material. To verify the result, two phases diffraction with known background and amorphous fraction were simulated. Also in this chapter, the atomic pair distribution function is directly obtained from the diffraction data by Fourier transforming the normalized total structure factor.