الفهرس 
Evaluation of residual ventricular septal defects (VSDs) after transcatheter closure
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Abstract
Introduction: The ventricular septal defect (VSD) is the most common form of congenital heart defects. Transcatheter closure of ventricular septal defects is a well-established procedure. Recently different types of devices have been used to close different types of VSDs successfully (off- label use) Objectives: The purpose of this study was to evaluate the incidence of residual shunts after VSD transcatheter device closure using different types of devices and detect risk factors associated with residual VSD after transcatheter closure and demonstrate the prognosis of residual shunts on long term follow up.Patients and Methods: we retrospectively evaluated 75 patients who had congenital VSDs and underwent transcatheter VSD closure at Pediatric Cardiac Catheterization Unit, Cairo University children hospital between 2013 and 2019 with a median follow up period of 36 months ranging from 1 to 83 months.Results: Procedures were successful in 70 out of 75 patients (93.3%). The complete VSD closure rate immediately after the procedure was (80.8%) this rate increased to (82%) at last follow up. The median age was 8 years (1.5 to 17 years) and mean weight at time of follow up was 29.54 ± 11.15 kg ranging from 10 to 70 kg.The mean defect size was 6.43± 2.15 mm ranging from 3.5 to 15 mm as assessed by TTE before procedure and 5.89 ± 2.28 mm (ranging between 3.00 and 13.50 mm) by angiography during procedure with a statistically significant p value (p value = 0.024).The mean LA Z score was (+0.39) before procedure while it was (-0.78) after VSD closure with a statistically significant p value. (p<0.001), the mean LVEDD Z score was (+1.37) before VSD closure while it was (+0.36) after VSD closure with a statistically significant p value. (p=0.001)