الفهرس | Only 14 pages are availabe for public view |
Abstract Two elemental microprobe spectrometers, scanning electron microscope (SEM) JSM-5600-LV equipped with energy dispersive x-ray spectrometer (EDX) OXFORD and laser ablation (LA) GEOLAS-MERCHANTEK attached to double focusing inductively coupled plasma mass spectrometer (ICP^MS) JMS-PLASMAX2, are used in the -study. Optimization of the operational parameters of the spectrometers are performed to reach good precision and accuracy for measuring concentrations of major, minor elements and oxides using SEM-EDX, and trace element concentrations using LA-ICP-MS in solids. The thesis includes four chapters. Chapter (1), includes an introduction and aim of the work. Chapter (2) contains the theoretical considerations and technical aspects of the energy dispersive x-ray spectrometer and its combination with the scanning electron microscope producing microprobe spectrometer for solid surfaces. Moreover, the theoretical considerations and technical concepts of the laser ablation system and its attachment to the double focusing inductively coupled plasma mass spectrometer producing microprobe trace elemental analyses for solid surfaces and bulk materials. |