الفهرس 
Chapter 1 IntroductionOnly 14 pages are availabe for public view
 |  | from | 158 |  |  |
| | | from | 158 | | |
Abstract
”In this thesis we introduce the quantum mechanical approach as a more physically- realistic model to accurately quantify the electron-photon interaction in Photon-Induced Near-Field Electron Microscopy (PINEM). Further, we compare the maximum coupling speed between the electrons and the photons in the quantum and classical regime. For a nano-sphere of radius 2.13nm, full quantum calculations show that the maximum coupling between photon and electron occurs at a slower speed than classical calculations report. In addition, a significant reduction in PINEM field intensity is observed for the full quantum model. Furthermore, we discuss the size limitation for particles imaged using the PIMEN technique and the role of the back- ground material in improving the PINEM intensity. We further report a significant reduction in the PINEM intensity in nearly touching plasmonic particles (0.3nm gap)due to tunneling effect. The thesis is organized as follows: In chapter 1, we introduce an introduction to the problem under study, then we present the thesis objective and contribution. In chapter 2, an overview of classical modeling techniques is introduced. Chapter 3, presents the plasmonics and its importance,then the type of surface plasmon, and its applications. Chapter 4, describes the quantum model, and its limitations, then the Quantum Correc- tion Model (QCM) approach is presented, and its importance. Additionally, an example of sodium sphere is simulated to show the importance of the Quantum Correction Model (QCM). In chapter 5, the theory and applications of the Photon-Induced Near-Field Electron Microscopy Technique are introduced. Further, a brief history of microscopy is included in chapter 5. An example is also simulated to prove the validity of PINEM technique to show the tunneling effect at very small gap sizes. chapter 6, introduce the quantum mechanical approach as a more physically-realistic model to accurately quantify the electron-photon interaction in Photon-induced near-field electron microscopy (PINEM). The final chapter, contains some concluding remarks and the suggested future work .